Test Services
Applications
| Mobile • BATXband • PA • Transceiver • LNA • RF Switch • Flash • RF Switch • Power Management |
Connection • NFC • Automotive • Bluetooth • WiFi/Zigbee • TV tuner • BLE |
Others • Logics • Power & Lighting • Audio & Video • Motor Controller |
Tester instruction
What ATXSZ can offer in Tester:
| 1. | ATXSZ have typical Testers as V93K series(C200/PS800/PS1600), NI (PXI/STS), uFlex, Magnum , T2K, LTX-CX, PAX/AC,ASL1K, SPEA, uParset, ETS364, EST88, MS7000, Changchuan CT8280,Accrotest ST8200 and etc. Can support most of IC applications. |
| 2. | ATXSZ can provide test solution bATXd on above test platform. |
Handler and Packer instruction
What ATXSZ can offer in handler & Packer:
| 1. | ATXSZ have typical high/low/room temperature Pick & Place, gravity and strip Handlers and tube in, tray in & bowl feeder Packers for various packages from 1*0.6 to 12*12. |
| 2. | ATXSZ can provide the tooling design (change kit, socket, pin, contactor and etc) bATXd on customer’s requirement. |
ATXSZ CP Capacity
ATXSZ wafer Test can offer:
• High Pin Count
• Up to sites test
• Analog & RF wafer test
• MPW wafer Test
What ATXSZ can offer in handler & Packer:
| 1. |
ATXSZ have typical probers as EG4090, and TEL P12 can support 5 inch to 12 inch wafer on various temperature wafer testing.
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| 2. | ATXSZ have many kinds of tooling can support wafer inspection. |
| 3. |
ATXSZ can design & manufacture the probe card bATXd on customer’s requirement.
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| 4. | ATXSZ can support the on-site probe card maintain & repair support. |
| 5. | ATXSZ have many kinds of CP software to support wafer map convert, wafer map reading, releATX criteria control and etc. |
Test Engineering Team Profile
10 engineers have more than 9 years working experiences from Year 2003. Have long & long co-work experiences with each customers.
Engineering Capacity:
| 1. | Test program development/debug, data analysis. |
| 2. | Test hardware/tooling design/management. |
| 3. | Continuously improvement projects as test stability improvement, yield & output improvement, test quality improvement. |
